Wednesday, May 02, 2007

Ionic liquids' Etch a Sketch surprise

Secondary ion mass spectrometry (SIMS) employs an ion beam (e.g., gallium ions) allowing the chemical analysis of surfaces. When such was directed toward ionic liquids, the result fires electrons out of the liquid's surface, creating a dark pattern that can not only be written and read, but also erased and rewritten. Read all about it here.

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